86100D High-Bandwidth Oscilloscope Mainframe

I. Core Performance: Redefining Benchmarks for High-Speed Measurement Built on robust hardware architecture, the 86100D DCA-X delivers precise end-to-end control from signal acquisition to data analysis with industry-leading core specifications: Ultra-wide Bandwidth and Multi-channel Parallel Acquisition The mainframe achieves up to 90 GHz bandwidth (configurable beyond 100 GHz with specific options) and features 16 synchronized acquisition channels for simultaneous high-speed signal capture across multiple ports, satisfying test requirements for high-density parallel designs. Ultra-low Jitter and Noise Floor Boasting ultra-low inherent jitter of 100 fs RMS and a noise floor as low as 250 μV, the instrument minimizes measurement errors originating from the test equipment itself to enable accurate characterization of critical parameters including signal jitter and amplitude for high-speed waveforms. High-precision Timebase and Sampling Performance Equipped with an optional Precision Timebase (PTB), the unit provides a minimum horizontal scale of 500 fs/div and maximum time-interval resolution of 62.5 fs. Combined with a 14-bit A/D converter and maximum record length of 32 M samples, it reconstructs fine waveform details of high-speed signals faithfully. II. Versatile Test Capabilities: Full Coverage for Optical, Electrical and Link Applications Thanks to modular expansion and integrated software functionality, the 86100D DCA-X adapts flexibly to optical, electrical and link characterization testing to deliver multi-purpose measurement value on a single platform: 1. Optical Test Solution When paired with optical modules such as the 86105C, it supports design validation and production testing of optical transceivers. Calibration is available for mainstream wavelengths including 850 nm, 1310 nm and 1550 nm alongside core functions: eye diagram analysis, reference receiver testing and mask compliance verification. For advanced modulation formats like PAM‑4, the 86100D‑9FP software option enables comprehensive analysis of eye width, amplitude levels and linearity; all plug-in modules feature native support for PAM‑N measurements. 2. Electrical Test Solution Optimized for ASIC, FPGA and IC development, it performs waveform capture, jitter decomposition and amplitude analysis of high-speed digital signals. Compliance testing is supported for high-speed serial buses such as PCI Express, USB 3.0 and HDMI, with an embedded library of over 50 standard masks plus automated margin analysis for one-click compliance report generation. The enhanced jitter analysis software (Option 200) breaks down jitter into random jitter (RJ) and periodic jitter (PJ) components to pinpoint root causes of signal degradation. 3. Link Characterization Solution TDR/TDT and S‑parameter measurement capabilities deliver accurate impedance and transmission characterization for serial interconnects, cables and PCBs. With the InfiniiSim‑DCA software option (SIM Option), fixture and cable de‑embedding/embedding removes signal attenuation induced by test fixtures to recover the genuine electrical performance of devices under test (DUT).