4156A Semiconductor Parameter Analyzer

The 4156A Semiconductor Parameter Analyzer is a Digital sweep parameter and a reliable tester, powerful failure analysis tool, and automated incoming inspection tool all in one package. Features： High-resolution/accuracy and wide range; I: 1fA to 1A (20fA offset accuracy), V: 1µV to 200V Fully-automated I-V sweep measurements with DC or pulse mode, expandable up to six SMUs Synchronized stress/measure function, two high-voltage pulse generator units (±40V) Time-domain measurement: 60µS variable intervals, up to 10,001 points Easy to use: knob-sweep similar to curve tracer, automatic analysis functions Automation: built-in HP Instrument BASIC, trigger I/O capability